High speed communication tester

ML4035 High speed interconnect tester

ML4035 High speed interconnect tester

- Series: High speed communication tester - Brand: Te-lead

The ML4035 is a state-of-the-art TDR/TDT and a Digital Sampling Oscilloscope at the same time. The DSO automatically performs accurate eye- diagram analysis at 35 GHz to characterize the quality of transmitters and receivers, implementing a statistical under-sampling technique with comprehensive software libraries used for eye measurements, jitter analysis and processing of NRZ/PAM4 data. The true- differential TDR/TDT is used to determine the impedance profile, reflection and transmission losses of components on 4 channels simultaneously. It is designed for characterization as well as manufacturing. The 4 differential PPG ports can generate pulse patterns at 53 Gpbs NRZ, thus enabling Sdd21 measurements beyond 35 GHz. The ML4035 can be configured to measure TDR with a range of 10 meters. It has a pulse rise time of 12ps that allows to resolve impedance discontinuities as close as 1.5mm apart. The dynamic range is 60dB.

Product Overview

The ML4035-TDR is a state-of-the-art combination of a TDR and Digital Sampling Oscilloscope. The DSO performs accurate eye- diagram analysis at 35 GHz to characterize the quality of transmitters and receivers, implementing a statistical under-sampling technique with comprehensive software libraries for eye measurements, jitter analysis and processing of NRZ/PAM4 data. The true-differential TDR can determine the impedance profile and reflection loss on 4 channels simultaneously. It is designed and suited both for characterization as well as manufacturing. The 4 differential PPG ports can generate pulse patterns up to 58 Gbps NRZ, enabling Sdd21 measurements beyond 32 GHz. The ML4035-TDR can be configured to measure TDR with a range of 10 meters. It has a pulse rise time of 12 ps that allows to resolve impedance discontinuities as close as 1.5 mm apart. The dynamic range is 40 dB. The ML4035-32 is a 32 GHz variant that excludes TDR capability and can be used for applications such as TIA testing and for other BERT-Scope applications.

Technical Parameter

TDR/TDT features

• High Resolution TDR/TDT measurements

• Low cost quadruple 35 GHz Time Domain Reflectometry / Transmission optimized for high speed tests and measurements

• Impedance Profile Measurement

• Determination of the magnitude and polarity of any back reflected signal

• 4 ports per module expandable up to 32+

• 4x35 GHz analog bandwidth

• Low power dissipation

• Sample aperture jitter below 60 fs


S-parameters

• Return loss

• Insertion loss

• Crosstalk

• Accurate multiport S-parameters


DSO features

• Low cost quadruple 35 GHz Digital Sampling Scope optimized for high speed data analysis

• High Fidelity Signal Capture

• Low intrinsic Jitter

• Control of multiple modules enabled through Fast Ethernet.

• User friendly GUI, high throughput APIs and libraries. The software supports both Linux and Windows.

• Supports external API calls from other software e.g. LabView.

• Repeatable performance and traceable to standards

• Single ended and differential electrical inputs for each of the four channels

• Color graded persistence in eye and pattern capture modes

• Ability to analyze and load captured data into the simulator

• Capability to save statistical measurement and data files for multiple DSOs

• Full eye measurements can be attained in the tens of milliseconds


Pulse Pattern Generator

• Data Rates 23 – 29 GBd and 46 – 58 GBd

• Ability to tune the bit rate in steps of 100 kbps and find the RX PLL locking margin.

• High frequency clock out > 2.4 GHz

• Independent control of inner eye levels

• Up to 0.8 Vppd output swing

• Supports Gray coding and polarity inversion

• Available patterns are:

• PRBS 7/9/11/13/15/16/23/31/58 and their inverses

• PRBS13Q, PRBS31Q

• SSPRQ and SSPR

• Square wave, JP03A/B, CID JTOL pattern

• Error injection

• 3-tap FIR Pre- and Post-emphasis 6dB

Error Detector

• Adaptive DFE and FFE with reflection canceller.

• SNR monitoring over time.

• PAM histogram monitor.

• PAM slicer threshold adjustable.

• Error-detection on following patterns:

PRBS 7/9/11/13/15/16/23/31

PRBS13Q and PRBS31Q

• Automatic pattern detection.

• LOS indicators.


Selection and Accessories

Option

Description

ML4035

Time Domain Reflectometer (TDR) with 2.4 mm connectors

3YW

Total 3-year warranty

CAL

Single calibration

3YWC

Total 3-year warranty with 3 annual calibrations

Option 29

2.92 mm connectors

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