NFC Xplorer Inline tester
- Series: NFC Tester - Brand: Te-lead
NFC Xplorer inline is a quality assurance test tool that additionally allows encoding of NFC and HF RFID tags and labels. The device is setup to support the maximum speed allowed by the protocol and the tag chip.The device consists of 2 elements, the NFC Xplorer Inline itself and a test antenna (set). A Secure Access Module, the MIFARE SAM AV3, is provided optionally.
A set of 3 test antennas together with square and round shielding panels are provided covering all NFC tag type classes 1-6 to meet production testing requirements for any kind of NFC tags and labels.
The results table give full overview of the quality assurance testing including the possibility to save it as a report.
KEY BENEFITS
More flexibility in creating an own performance matrix
Better analysis while saving time and cost
Testing for performance on 13.56 MHz at high speed (> 100k UPH)
Improves overall quality of the product
Full quality assurance in production
Support of various NFC Tag types
Security, crypto support (SAM, TAM)
Variable H-field strength
Provided a complete solution including antennas to support for class 1 – 6 tags
Read / Write mode for encoding and personalization
Test label operating field range
GPIO for external trigger
Serial interface for communication
Supported standards:
ISO/IEC 14443A and B
ISO/IEC 15693
